Wing Sheung Chan

Signal and background modelling 91 0 20 40 60 80 100 120 ) [GeV] Z ( T p 0 0.01 0.02 0.03 0.04 0.05 0.06 0.07 Normalised number of events Fiducial measurement MC truth τ l → Z 0 20 40 60 80 100 120 ) [GeV] Z ( T p truth 0.94 0.96 0.98 1 1.02 1.04 1.06 1.08 Signal samples correction scale factor 0 20 40 60 80 100 120 ) [GeV] Z ( T p 0 0.01 0.02 0.03 0.04 0.05 0.06 0.07 Normalised number of events Fiducial measurement MC truth τ τ → Z 0 20 40 60 80 100 120 ) [GeV] Z ( T p truth 0.9 0.95 1 1.05 1.1 1.15 1.2 Z → tt samples correction scale factor 0 20 40 60 80 100 120 ) [GeV] Z ( T p 0 0.01 0.02 0.03 0.04 0.05 0.06 0.07 Normalised number of events Fiducial measurement MC truth ll → Z 0 20 40 60 80 100 120 ) [GeV] Z ( T p truth 0.95 1 1.05 1.1 1.15 1.2 Z → ll samples correction scale factor Figure 5.2.: Normalised simulated p T ( Z ) distributions (left column) for the signal (top row), Z → ττ (middle row) and Z → `` (bottom row) samples compared to the measured distribution, and the corresponding p T ( Z ) correction scale factors (right column). For the p T ( Z ) distributions, the bin contents are divided by the bin widths in units of GeV. The rightmost bins include overflow events up to p T ( Z ) = 2500 GeV . The errors for both the predicted and measured distributions are not visible in the displayed scale, while the errors for the correction scale factors are represented by the error bars.