Wing Sheung Chan

94 Signal and background modelling 0 200 400 600 800 1000 1200 1400 Events / 5 GeV Data fakes had-vis τ→ jet ττ→ Z ll → Z Others Total uncertainty -1 = 13 TeV, 139 fb s 1P τ µ , ll CRZ 0 10 20 30 40 50 60 70 80 ) [GeV] had-vis τ ( T p 0.5 0.75 1 1.25 1.5 Data / pred. 0 200 400 600 800 1000 1200 Events / 0.5 Data fakes had-vis τ→ jet ττ→ Z ll → Z Others Total uncertainty -1 = 13 TeV, 139 fb s 1P τ µ , ll CRZ 3 − 2 − 1 − 0 1 2 3 ) had-vis τ ( η 0.5 0.75 1 1.25 1.5 Data / pred. 0 200 400 600 800 1000 1200 1400 1600 1800 2000 Events / 5 GeV Data fakes had-vis τ→ jet ττ→ Z ll → Z Others Total uncertainty -1 = 13 TeV, 139 fb s 1P τ µ , ll CRZ 0 10 20 30 40 50 60 70 80 [GeV] miss T E 0.5 0.75 1 1.25 1.5 Data / pred. 0 200 400 600 800 1000 1200 1400 1600 1800 2000 Events / 5 GeV Data fakes had-vis τ→ jet ττ→ Z ll → Z Others Total uncertainty -1 = 13 TeV, 139 fb s 1P τ µ , ll CRZ 20 40 60 80 100 120 140 160 ) [GeV] τ , µ ( coll m 0.5 0.75 1 1.25 1.5 Data / pred. Figure 5.5.: Expected and observed distributions of p T ( τ had - vis ) , η ( τ had - vis ) , E miss T and m coll ( µ, τ ) in the CRZ `` of the µτ channel. In the lower panel of each plot, the ratios of the observed yields to the predicted background yields are shown. The hatched error bands represent the combined statistical and systematic uncer- tainties.