Wing Sheung Chan

100 Signal and background modelling 0 200 400 600 800 1000 1200 1400 1600 Events / 5 GeV Data fakes had-vis τ→ jet ττ→ Z ll → Z , single-t tt )+jets ντ→ W( diboson Higgs Total uncertainty -1 = 13 TeV, 139 fb s 1P τ e FRQ, 20 40 60 80 100 120 140 160 ) [GeV] τ , e ( vis m 0.5 0.75 1 1.25 1.5 Data / pred. 0 50 100 150 200 250 300 Events / 5 GeV Data fakes had-vis τ→ jet ττ→ Z ll → Z , single-t tt )+jets ντ→ W( diboson Higgs Total uncertainty -1 = 13 TeV, 139 fb s 3P τ e FRQ, 20 40 60 80 100 120 140 160 ) [GeV] τ , e ( vis m 0.5 0.75 1 1.25 1.5 Data / pred. 0 100 200 300 400 500 600 700 800 900 Events / 5 GeV Data fakes had-vis τ→ jet ττ→ Z ll → Z , single-t tt )+jets ντ→ W( diboson Higgs Total uncertainty -1 = 13 TeV, 139 fb s 1P τ µ FRQ, 20 40 60 80 100 120 140 160 ) [GeV] τ , µ ( vis m 0.5 0.75 1 1.25 1.5 Data / pred. 0 20 40 60 80 100 120 140 160 Events / 5 GeV Data fakes had-vis τ→ jet ττ→ Z , single-t tt )+jets ντ→ W( diboson Higgs Total uncertainty -1 = 13 TeV, 139 fb s 3P τ µ FRQ, 20 40 60 80 100 120 140 160 ) [GeV] τ , µ ( vis m 0.5 0.75 1 1.25 1.5 Data / pred. Figure 5.7.: Expected and observed distributions of m vis ( `, τ ) in FRQ. In the lower panel of each plot, the ratios of the observed yields to the predicted background yields are shown. The hatched error bands represent the combined statistical and systematic uncertainties. The unusually large uncertainties in certain bins are due to MC samples with occasionally large event weights being used in the calculation of R p FRQ or k p . The last bin in each plot includes overflow events.