Wing Sheung Chan

Signal and background modelling 101 0 200 400 600 800 1000 Events / 5 GeV Data fakes had-vis τ→ jet ττ→ Z ll → Z , single-t tt diboson Higgs Total uncertainty -1 = 13 TeV, 139 fb s 1P τ e FRZ, 20 40 60 80 100 120 140 160 ) [GeV] τ , e ( vis m 0.5 0.75 1 1.25 1.5 Data / pred. 0 20 40 60 80 100 120 Events / 5 GeV Data fakes had-vis τ→ jet ll → Z , single-t tt diboson Total uncertainty -1 = 13 TeV, 139 fb s 3P τ e FRZ, 20 40 60 80 100 120 140 160 ) [GeV] τ , e ( vis m 0.5 0.75 1 1.25 1.5 Data / pred. 0 200 400 600 800 1000 1200 Events / 5 GeV Data fakes had-vis τ→ jet ll → Z , single-t tt diboson Total uncertainty -1 = 13 TeV, 139 fb s 1P τ µ FRZ, 20 40 60 80 100 120 140 160 ) [GeV] τ , µ ( vis m 0.5 0.75 1 1.25 1.5 Data / pred. 0 20 40 60 80 100 120 140 160 Events / 5 GeV Data fakes had-vis τ→ jet ττ→ Z ll → Z diboson Total uncertainty -1 = 13 TeV, 139 fb s 3P τ µ FRZ, 20 40 60 80 100 120 140 160 ) [GeV] τ , µ ( vis m 0.5 0.75 1 1.25 1.5 Data / pred. Figure 5.8.: Expected and observed distributions of m vis ( `, τ ) in FRZ. In the lower panel of each plot, the ratios of the observed yields to the predicted background yields are shown. The hatched error bands represent the combined statistical and systematic uncertainties. The last bin in each plot includes overflow events.