Wing Sheung Chan

102 Signal and background modelling 0 1000 2000 3000 4000 5000 6000 7000 8000 9000 Events / 5 GeV Data fakes had-vis τ→ jet ττ→ Z ll → Z , single-t tt )+jets ντ→ W( diboson Higgs Total uncertainty -1 = 13 TeV, 139 fb s 1P τ e FRT, 20 40 60 80 100 120 140 160 ) [GeV] τ , e ( vis m 0.5 0.75 1 1.25 1.5 Data / pred. 0 100 200 300 400 500 Events / 5 GeV Data fakes had-vis τ→ jet ττ→ Z , single-t tt )+jets ντ→ W( diboson Higgs Total uncertainty -1 = 13 TeV, 139 fb s 3P τ e FRT, 20 40 60 80 100 120 140 160 ) [GeV] τ , e ( vis m 0.5 0.75 1 1.25 1.5 Data / pred. 0 1000 2000 3000 4000 5000 6000 7000 Events / 5 GeV Data fakes had-vis τ→ jet ττ→ Z ll → Z , single-t tt )+jets ντ→ W( diboson Higgs Total uncertainty -1 = 13 TeV, 139 fb s 1P τ µ FRT, 20 40 60 80 100 120 140 160 ) [GeV] τ , µ ( vis m 0.5 0.75 1 1.25 1.5 Data / pred. 0 100 200 300 400 500 Events / 5 GeV Data fakes had-vis τ→ jet ττ→ Z , single-t tt )+jets ντ→ W( diboson Higgs Total uncertainty -1 = 13 TeV, 139 fb s 3P τ µ FRT, 20 40 60 80 100 120 140 160 ) [GeV] τ , µ ( vis m 0.5 0.75 1 1.25 1.5 Data / pred. Figure 5.9.: Expected and observed distributions of m vis ( `, τ ) in FRT. In the lower panel of each plot, the ratios of the observed yields to the predicted background yields are shown. The hatched error bands represent the combined statistical and systematic uncertainties. The last bin in each plot includes overflow events.