Wing Sheung Chan

Statistical interpretation and results 113 0 2000 4000 6000 8000 10000 12000 14000 16000 18000 Events / 0.025 Data fakes had-vis τ→ jet ττ→ Z ll → Z Others Total uncertainty ) 4 − 10 × = 5 Β ( τ e → Z l ATLAS -1 = 13 TeV, 139 fb s 1P τ e SR, 0.1 0.2 0.3 0.4 0.5 0.6 0.7 0.8 0.9 Combined NN output 0.9 0.95 1 1.05 1.1 Data / pred. ) 7 − 10 × 1 − = Β Best-fit signal ( 0 500 1000 1500 2000 2500 3000 3500 4000 Events / 0.025 Data fakes had-vis τ→ jet ττ→ Z ll → Z Others Total uncertainty ) 4 − 10 × = 5 Β ( τ e → Z Z ATLAS -1 = 13 TeV, 139 fb s 3P τ e SR, 0.2 0.3 0.4 0.5 0.6 0.7 0.8 0.9 Combined NN output 0.9 0.95 1 1.05 1.1 Data / pred. ) 7 − 10 × 1 − = Β Best-fit signal ( 0 2000 4000 6000 8000 10000 12000 14000 16000 Events / 5 GeV Data fakes had-vis τ→ jet ττ→ Z ll → Z Others Total uncertainty ) 4 − 10 × = 5 Β ( τ e → Z ATLAS -1 = 13 TeV, 139 fb s 1P τ e , τ τ CRZ 70 75 80 85 90 95 100 105 110 ) [GeV] τ , e ( coll m 0.9 0.95 1 1.05 1.1 Data / pred. 0 500 1000 1500 2000 2500 3000 3500 4000 4500 Events / 5 GeV Data fakes had-vis τ→ jet ττ→ Z ll → Z Others Total uncertainty ) 4 − 10 × = 5 Β ( τ e → Z ATLAS -1 = 13 TeV, 139 fb s 3P τ e , τ τ CRZ 70 75 80 85 90 95 100 105 110 ) [GeV] τ , e ( coll m 0.9 0.95 1 1.05 1.1 Data / pred. Figure 6.1.: Best-fit expected and observed distributions of the combined NN output in the SR and m coll ( e, τ ) in CRZ ττ of the eτ channel. In the lower panel of each plot, the ratios of the observed yields (dots) and the best-fit background-plus-signal yields (solid red line) to the best-fit background yields are shown. The hatched error bands represent the combined statistical and systematic uncertainties. The last bin of combined NN output in the SR includes overflow events.