Wing Sheung Chan

114 Statistical interpretation and results 0 2000 4000 6000 8000 10000 12000 Events / 0.025 Data fakes had-vis τ→ jet ττ→ Z ll → Z Others Total uncertainty ) 4 − 10 × = 5 Β ( τµ→ Z ATLAS -1 = 13 TeV, 139 fb s 1P τ µ SR, 0.1 0.2 0.3 0.4 0.5 0.6 0.7 0.8 0.9 Combined NN output 0.9 0.95 1 1.05 1.1 Data / pred. ) 6 − 10 × = 4 Β Best-fit signal ( 0 1000 2000 3000 4000 5000 Events / 0.025 Data fakes had-vis τ→ jet ττ→ Z ll → Z Others Total uncertainty ) 4 − 10 × = 5 Β ( τµ→ Z ATLAS -1 = 13 TeV, 139 fb s 3P τ µ SR, 0.2 0.3 0.4 0.5 0.6 0.7 0.8 0.9 Combined NN output 0.9 0.95 1 1.05 1.1 Data / pred. ) 6 − 10 × = 4 Β Best-fit signal ( 0 2000 4000 6000 8000 10000 12000 14000 Events / 5 GeV Data fakes had-vis τ→ jet ττ→ Z ll → Z Others Total uncertainty ) 4 − 10 × = 5 Β ( τµ→ Z ATLAS -1 = 13 TeV, 139 fb s 1P τ µ , τ τ CRZ 70 75 80 85 90 95 100 105 110 ) [GeV] τ , µ ( coll m 0.9 0.95 1 1.05 1.1 Data / pred. 0 1000 2000 3000 4000 5000 Events / 5 GeV Data fakes had-vis τ→ jet ττ→ Z ll → Z Others Total uncertainty ) 4 − 10 × = 5 Β ( τµ→ Z ATLAS -1 = 13 TeV, 139 fb s 3P τ µ , τ τ CRZ 70 75 80 85 90 95 100 105 110 ) [GeV] τ , µ ( coll m 0.9 0.95 1 1.05 1.1 Data / pred. Figure 6.2.: Best-fit expected and observed distributions of the combined NN output in the SR and m coll ( µ, τ ) in CRZ ττ of the µτ channel. In the lower panel of each plot, the ratios of the observed yields (dots) and the best-fit background-plus-signal yields (solid red line) to the best-fit background yields are shown. The hatched error bands represent the combined statistical and systematic uncertainties. The last bin of combined NN output in the SR includes overflow events.