Wing Sheung Chan

116 Statistical interpretation and results 0.1 − 0 0.1 ) τ l → Z ( B Best-fit impact on -bin) T p -bin 4th track- T p 1P fake factor (4th -bin) T p -bin 2nd track- T p 1P fake factor (2nd -bin) T p -bin 2nd track- T p 1P fake factor (4th jet energy scale, grouped NP 2 jet energy scale, grouped NP 1 1P tau energy scale, in-situ fit, central region 3P tau energy scale, model, forward region tau identification eff., systematics τ τ → Z overall yield of 1P tau energy scale, model, forward region 40 ≥ bin T p 1P tau identification eff., statistics full-Run-2 luminosity -bin) T p -bin 1st track- T p 1P fake factor (1st 1P tau energy scale, model, central region -bin statistics) T p 3P fake factor (1st -bin) T p -bin 1st track- T p 1P fake factor (2nd 1P tau energy scale, in-situ exp., forward region 1P tau energy scale, in-situ fit, forward region 3P tau energy scale, in-situ fit, forward region -bin) T p -bin 4th track- T p 1P fake factor (2nd MET soft track resolution, perpendicular -bin statistics) T p 3P fake factor (2nd top backgrounds cross section electron identification eff. -bin) T p -bin 5th track- T p 1P fake factor (4th -bin) T p -bin 5th track- T p 1P fake factor (3rd -bin) T p -bin 5th track- T p 1P fake factor (2nd Diboson backgrounds cross section 3P tau energy scale, in-situ exp., forward region 3P tau energy scale, model, central region -veto, true electron e 3P tau -tagging efficiency b -jet b 1P tau energy scale, in-situ exp., central region )+jets cross section ν τ → ( W cross section ll → Z 3P tau energy scale, in-situ fit, central region 3P tau energy scale, in-situ exp., central region overall yield of 3P fakes overall yield of 1P fakes 1P tau electron fake SF statistics 2 − 1.5 − 1 − 0.5 − 0 0.5 1 1.5 2 Best-fit value ATLAS s = 13 TeV, 139 fb -1 Best-fit nuisance parameter Best-fit normalisation factor impact σ Best-fit +1 impact σ Best-fit -1 Figure 6.3.: The best-fit values of the nuisance parameter ranked in their estimated impact on µ s for the eτ channel.