Wing Sheung Chan

Distributions and modelling of the neural network input variables 137 0 10000 20000 30000 40000 50000 60000 Events / 10 GeV Data fakes had-vis τ→ jet ττ→ Z ll → Z Others Total uncertainty ) 3 − = 10 Β ( τµ→ Z -1 = 13 TeV, 139 fb s 1P τ µ SR, 0 20 40 60 80 100 120 140 160 180 ) [GeV] had-vis τ ( ∧ E 0.5 0.75 1 1.25 1.5 Data / pred. 0 2000 4000 6000 8000 10000 12000 14000 16000 18000 Events / 10 GeV Data fakes had-vis τ→ jet ττ→ Z ll → Z Others Total uncertainty ) 3 − = 10 Β ( τµ→ Z -1 = 13 TeV, 139 fb s 3P τ µ SR, 0 20 40 60 80 100 120 140 160 180 ) [GeV] had-vis τ ( ∧ E 0.5 0.75 1 1.25 1.5 Data / pred. 0 10000 20000 30000 40000 50000 60000 70000 80000 90000 Events / 10 GeV Data fakes had-vis τ→ jet ττ→ Z ll → Z Others Total uncertainty ) 3 − = 10 Β ( τµ→ Z -1 = 13 TeV, 139 fb s 1P τ µ SR, 40 − 20 − 0 20 40 60 ) [GeV] had-vis τ ( x ∧ p 0.5 0.75 1 1.25 1.5 Data / pred. 0 2000 4000 6000 8000 10000 12000 14000 16000 18000 20000 22000 24000 Events / 10 GeV Data fakes had-vis τ→ jet ττ→ Z ll → Z Others Total uncertainty ) 3 − = 10 Β ( τµ→ Z -1 = 13 TeV, 139 fb s 3P τ µ SR, 40 − 20 − 0 20 40 60 ) [GeV] had-vis τ ( x ∧ p 0.5 0.75 1 1.25 1.5 Data / pred. 0 5000 10000 15000 20000 25000 30000 35000 40000 45000 Events / 10 GeV Data fakes had-vis τ→ jet ττ→ Z ll → Z Others Total uncertainty ) 3 − = 10 Β ( τµ→ Z -1 = 13 TeV, 139 fb s 1P τ µ SR, 0 20 40 60 80 100 120 140 160 180 ) [GeV] had-vis τ ( z ∧ p 0.5 0.75 1 1.25 1.5 Data / pred. 0 2000 4000 6000 8000 10000 12000 Events / 10 GeV Data fakes had-vis τ→ jet ττ→ Z ll → Z Others Total uncertainty ) 3 − = 10 Β ( τµ→ Z -1 = 13 TeV, 139 fb s 3P τ µ SR, 0 20 40 60 80 100 120 140 160 180 ) [GeV] had-vis τ ( z ∧ p 0.5 0.75 1 1.25 1.5 Data / pred. Figure C.6.: Expected and observed distributions of ˆ E ( τ had - vis ) , ˆ p x ( τ had - vis ) and ˆ p z ( τ had - vis ) in the SR of the µτ channel. In the lower panel of each plot, the ratios of the observed yields to the predicted background yields are shown. The hatched error bands represent the combined statistical and systematic uncertainties. The last bin in each plot includes overflow events.