Wing Sheung Chan

Summary 161 0 2000 4000 6000 8000 10000 12000 14000 16000 18000 Events / 0.025 Data fakes had-vis τ→ jet ττ→ Z ll → Z Others Total uncertainty ) 4 − 10 × = 5 Β ( τ e → Z ATLAS -1 = 13 TeV, 139 fb s 1P τ e SR, 0.1 0.2 0.3 0.4 0.5 0.6 0.7 0.8 0.9 Combined NN output 0.9 0.95 1 1.05 1.1 Data / pred. ) 7 − 10 × 1 − = Β Best-fit signal ( 0 500 1000 1500 2000 2500 3000 3500 4000 Events / 0.025 Data fakes had-vis τ→ jet ττ→ Z ll → Z Others Total uncertainty ) 4 − 10 × = 5 Β ( τ e → Z ATLAS -1 = 13 TeV, 139 fb s 3P τ e SR, 0.2 0.3 0.4 0.5 0.6 0.7 0.8 0.9 Combined NN output 0.9 0.95 1 1.05 1.1 Data / pred. ) 7 − 10 × 1 − = Β Best-fit signal ( 0 2000 4000 6000 8000 10000 12000 Events / 0.025 Data fakes had-vis τ→ jet ττ→ Z ll → Z Others Total uncertainty ) 4 − 10 × = 5 Β ( τµ→ Z ATLAS -1 = 13 TeV, 139 fb s 1P τ µ SR, 0.1 0.2 0.3 0.4 0.5 0.6 0.7 0.8 0.9 Combined NN output 0.9 0.95 1 1.05 1.1 Data / pred. ) 6 − 10 × = 4 Β Best-fit signal ( 0 1000 2000 3000 4000 5000 Events / 0.025 Data fakes had-vis τ→ jet ττ→ Z ll → Z Others Total uncertainty ) 4 − 10 × = 5 Β ( τµ→ Z ATLAS -1 = 13 TeV, 139 fb s 3P τ µ SR, 0.2 0.3 0.4 0.5 0.6 0.7 0.8 0.9 Combined NN output 0.9 0.95 1 1.05 1.1 Data / pred. ) 6 − 10 × = 4 Β Best-fit signal ( Figure S.3.: Best-fit expected and observed distributions of the combined neural network (NN) output in the signal regions (SR) of the eτ (top row) and µτ (bottom row) channels. In the lower panel of each plot, the ratios of the observed yields (dots) and the best-fit background-plus-signal yields (solid red line) to the best-fit background yields are shown. The hatched error bands represent the combined statistical and systematic uncertainties. The last bin in each plot includes overflow events.